QLX3 follows a unique design concept. It unites the benefits of both worlds, x-ray fluorescence analyzers (XRF) and spark spectrometers and avoids the pitfalls at the same time.
In detail this means:
capable to excite any material
full analytical scope! No lock-out elements, no long measurement times.
The system covers all relevant elements within 3-5 seconds at low limits of quantification
maintenance-free, no brushing, no cleaning
touch-screen allows easy operation.
high sample throughput, no heating up
QLX3 features latest technologies in excitation, detection and digital concept.
In contrast to classical spark spectrometers, QLX3 uses a laser to excite the sample and generate a plasma. We call this laser-OES, but the technology is also referred to as LIBS.
It offers some distinct advantages:
no or low argon
no electrode cleaning, no cross contamination
The detectors used in QLX3 are CMOS sensors. They are technically superior to previously used CCDs in many aspects: spectral response, dynamic range, speed. They allow single-pulse detection, a technology used for micro-analysis, depth profiling, and also to identify outliers and, thus, improve the precision of the instrument.
Finally, various digital services and general IoT functions, provide value propositions unseen in this type of instrument before.
Currently the below listed applications are available for QLX3.
If you have a special requirement, please do not hesitate to contact us.